Xiaowei Li

VLSI Testing and Fault-Tolerant Computing at ICT

CAS Invited talk at School of Electronic Engineering, Dublin City University on August 6, 2015

ABSTRACT: In this talk, Dr. Li will give an overview of VLSI and embedded system in mainland China, and an introduction to VLSI testing and fault-tolerant computing research at the state key lab of computer architecture (ICT, CAS), including VLSI design verification, VLSI testing, and on-chip fault-tolerance. He will give some newly achieved research results in these directions, as well as some successful applications (including on-board microprocessor systems). He will also introduce a newly established research direction, i.e., VLSI security at ICT, and a newly granted joint-research project.

This seminar is open to the public, all welcome.

Date: Thursday 6 August 2015

Time: 10 am – 11 am

Venue: S209